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Reduce or Eliminate Diagnostic-based NFF’s, CND’s and RTOK’s

Evaluate PHM as an Integrated System Capability

In recent years, military and aerospace programs have dedicated significant resources toward research in advanced predictive maintenance technologies. In particular, much of the research focused on prognostics—developing sensors and measurements that they hope will not only improve system readiness, but also reduce the costs of product sustainment. Designed to identify incipient failures at the lowest levels of the system architecture, prognostic sensors are typically the end result of extremely detailed, yet extremely localized, physics-of-failure ("PoF") analyses.

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Diagnostic Assessment of BIT and Sensors

Built-in-Test (BIT) is broadly used as a method to assist Design for Test (DFT) activities for digital designs during production. It may also provide a means to facilitate operational “testing” for the proper functioning of specific portions of a design prior to, or during operation.

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Synchronization of On-Board BIT and Guided Troubleshooting

Using the inherent power of Integrated Systems Diagnostic Design, or “ISDD”, the Expertise of the Diagnostic Design data is captured and vetted for accuracy and completeness within the eXpress diagnostic modeling process. As the functional and failure causes are propagated throughout the Design architecture during the Design Development process, the functional and failure interdependencies are also established and retained within the eXpress modeling process.

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Diagnostics Based on Expert Knowledge of the Diagnostic Design

Using the inherent power of Integrated Systems Diagnostic Design, or “ISDD”, the Expertise of the Diagnostic Design data is captured and vetted for accuracy and completeness within the eXpress diagnostic modeling process. As the functional and failure causes are propagated throughout the Design architecture during the Design Development process, the functional and failure interdependencies are also established and retained within the eXpress modeling process.

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BIT Optimization- Validation - Integration

Traditionally, Built-in-Test (BIT) has been assigned to “test” the presence of the proper functioning at various “testing locations or points”. Such test points have often been selected by the designer or the manufacturer based upon their specific expertise or available resources. If a more careful effort was to be required, then the determining of the BIT would require additional tools, technologies, expertise and then additional resources – meaning more cost and time.

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