eXpress approach and support for complex test types allows diagnostics to be generated for Intelligent IETMs:
Most every traditional diagnostic approach is constrained by being based on the unintegrated-with-design use of diagnostic design data – or by a test-to-failure probabilistic approach. Both approaches rely upon the algorithmic association of non-design-integrated design data and/or the non-design-integrated fielded data, to the assumed faults based upon an acceptable level of certainty from uncertain test coverages. These are both data-driven approaches to establishing a diagnostic capability. Unfortunately, neither are formed from an integrated approach that leverages the depth and breadth of the design development process, nor in a manner that can fully associate the data retrieved during the integrated support activities against the diagnostic integrity of the fielded design.