This overview of eXpress 7.0 is intended for our USA customers. As required DSI will setup a WebEx meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.
Schedule Date & Time: May 4, 11AM PST

This overview of eXpress 7.0 is intended for our non-USA customers. This topic will be relevant to the newest capabilities or features added to the eXpress Diagnostic Software Application and any of the integrated and optional eXpress Modules.
This Course Includes:
– What’s new in eXpress 7.0
– Describing the new features and their respective objectives in detail.
– The related new features to any integrated or optional eXpress Module
– Course subject matter will vary and will be presented at the beginning of each CE Course
– This Course may be divided into two (2) sessions depending on scope of Feature updates.

Required: eXpress
Optional: None

This overview of eXpress 7.0 is intended for our non-USA customers. As required DSI will setup a WebEx meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.
Schedule Date & Time: May 4, 3PM BST

This overview of eXpress 7.0 is intended for our non-USA customers. This topic will be relevant to the newest capabilities or features added to the eXpress Diagnostic Software Application and any of the integrated and optional eXpress Modules.
This Course Includes:
– What’s new in eXpress 7.0
– Describing the new features and their respective objectives in detail.
– The related new features to any integrated or optional eXpress Module
– Course subject matter will vary and will be presented at the beginning of each CE Course
– This Course may be divided into two (2) sessions depending on scope of Feature updates.

Required: eXpress
Optional: None

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains how to setup and use the eXpress Desktop Fault Insertion Feature for validating the diagnostic capability in the eXpress Model. Course includes:
– Framing the objectives to be performed in validating diagnostics for BIT and/or Guided Troubleshooting
– Discover the effectiveness of Fault Codes as used for Health Management applications.
– Validate that the diagnostics makes sense and was modeled as intended.
– Insert any random faults or sets of faults to ensure accurate isolation.

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains how to import model data from other applications or spreadsheets using customized templates and configurations to establish reusable, comprehensive and seamless data importing into eXpress.
This activity will feature the use of both the Topology Import and Grid View Features in eXpress.

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains how to use an eXpress model to describe the following:
  ● Dependency Modeling and eXpress
  ● Prognostics vs. Diagnostics
  ● Types of Diagnostics
    ○ Static
    ○ Dynamic
    ○ Semi-Dynamic
    ○ “Health Monitoring” (with static, dynamic or semi-dynamic)
This extended session of this topic will provide an in depth perspective on the following:
  ● Phases of Diagnostics
    ○ Fault Detection
    ○ Fault Isolation
    ○ Fault Resolution
  ● Diagnostic Inference
    ○ Hierarchical Diagnostic Inference
    ○ Hybrid Diagnostic Inference
    ○ Isolation Method (Common Cause vs. Multiple-Fault)
    ○ Fan-Out Refinement

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains how to use the eXpress Diagnostic Flow Diagram (DFD) to understand how diagnostics inferences are easily recognized and manipulated:
  ○ Displaying a single isolation path
    ■ Double-click on cell to display path up to and including that node
    ■ Click on the Diagnostic Study header to display entire DFD
  ○ Dotted Paths indicate tests that do not prove anything good
    ■ green = test for malfunction
    ■ gray = independent mode
  ○ Including Test Outcomes or Priorities in the Diagnostic Flow Diagram
  ○ Manipulating the detection order using the Detection List
  ○ Manipulating the Diagnostic Flow Diagram using right-click operations
  ○ Generating the Fault Group Details Report for a single fault group

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains how to use the eXpress Diagnostic Flow Diagram (DFD) to understand how diagnostics inferences are easily recognized and manipulated:
    ○ Including Test Outcomes or Priorities in the Diagnostic Flow Diagram
    ○ Manipulating the detection order using the Detection List
    ○ Manipulating the Diagnostic Flow Diagram using right-click operations
    ○ Generating the Fault Group Details Report for a single fault group
  ● System Status Display
    ○ Color Codes based on the Highlighted Node in the DFD
    ○ Colors are Documented in the Color Legend
    ○ Can Descend Into Lower Levels

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the impact and how to use the Advanced Diagnostic Algorithm settings within eXpress.
  ○ Algorithm Components
    ▪ Candidate groupings
    ▪ Test Weightings
    ▪ Cutoffs
  ○ Fault Detection Algorithms
    ▪ Detect Malfunctions with Fewest Tests
    ▪ Detect Probable Malfunctions
    ▪ Detect Critical Malfunctions
    ▪ Prove Operation with Fewest Tests
    ▪ Prove Maximum Operation Before Detecting Malfunction
    ▪ Minimize Switches in Monitored Stimuli
    ▪ Detect Using Fault Codes
  ○ Fault Isolation Algorithms
    ▪ Multiple-Fault (5 algorithms treating refinement differently)
    ▪ Common Cause (2 algorithms, one with an isolation cutoff)

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course)

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the impact and how to use the Advanced Diagnostic Algorithm settings within eXpress.
  ● The Diagnostic Study Options Dialog
    ○ Accessed by right-clicking on the DFD and selecting “Options…”
    ○ Display panel
      ▪ Controls size of cells in the DFD
      ▪ DFD can be disabled for large systems
    ○ Diagnostic Sequence panel
    ○ Test Selection panel
      ▪ Independent Mode
      ▪ Rules that constrain what tests are allowed during diagnostics
      ▪ Attribute-based test prioritization
    ○ Interpretation panel
    ○ Preferences panel
    ○ Advanced panel
      ▪ Reduce Repetition when diagnostics for large systems are calculated

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 Using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the use of Operating Modes and Diagnostic Scope within eXpress.
  ● Types of Subsets
    ○ Subsets based on Explicit Selections(s)
    ○ Attribute-based Subsets
    ○ Path-based subsets
    ○ Failure Severity-based subsets
    ○ Combination Subsets
  ● Creating and Manipulating Subsets
  ● Active Editing of Subsets
  ● Hierarchical Subsets and Duty Cycles
  ● Operating Modes
    ○ Manual and automatic Creation
  ● Using Operating Modes to Constrain Diagnostic Scope
    ○ Scaling (Detection) Statistics to Scope
    ○ Hiding Excluded Elements

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic uses specific Test Types in eXpress to Identify Test Coverage and Interference
  ● Coverage
    ○ The Functions/Failure Modes a Test has been designed to Test
    ○ Anything else that can be proven good during Testing
  ● Interference
    ○ Other Functions/Failure Modes that can cause a Test to Fail
    ○ Creation, Propagation and Observation Interference
  ● Symmetry
    ○ Symmetric Tests
    ○ Asymmetric Tests
    ○ Path-Based Tests
    ○ Coverage-Based Tests

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the benefits of alternative approaches to Defining Tests in eXpress
  ● Modeling for Test Definition
    ○ Intelligence in the Model
    ○ Functional Dependencies, States and Classes
  ● Constraints within Individual Tests
    ○ Intelligence in the Test Definitions
    ○ Stimuli, Anchors & Non-Detectable Coverage
  ● Imported Test Coverage
    ○ Intelligence is in the Spreadsheets
    ○ Limited to Signature, Inspection & BIT Tests
    ○ Tests based on Imported Failure Effects
    ○ Risk is External to eXpress

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the discusses the usages of Discrete and Continuous Coverage & Test Editing in eXpress
  ● Discrete Coverage
    ○ Coverage/Interference represents what can be Isolated by that Test
    ○ Can be defined as Non-Topological
    ○ May be adequate for Testability Analysis
    ○ Insufficient for developing actual Diagnostics
  ● Continuous Coverage
    ○ Coverage/Interference represents what can cause the Test to Fail
    ○ Usually requires a More Fully Developed Model
    ○ Sufficient for both Testability and Diagnostic Development
  ● Test Editing
    ○ Modal Editing vs. Active Editing
    ○ Interpretation of Colors During Test Editing
      ▪ Item Colors (Coverage/Interference)
      ▪ I/O Flag Colors (Test Locations/Stimuli)
      ▪ Net Colors (Functional Coverage/Failure Mode Coverage/Interference)

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the Techniques for Defining Coverage and Interference for Path-Based Tests in eXpress
  ● Constraining Test Coverage using States
    ○ Object States
      ▪ Display Options during Test Editing
      ▪ Marking Default States for Individual Objects
      ▪ State Control Dependencies
    ○ Design States
      ▪ Local Design States
      ▪ Active Editing of Design States
      ▪ Hierarchical Design States (Multi-Level Path-Based Testing)
      ▪ Using Design States to Model the Concept of Operation
      ▪ Auto-Generation of Design States
      ▪ Create Design States based on Test State Selection

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the Techniques for using Test Coverage Filters (Function/Failure Classes) in eXpress
  ● Creating and Editing Classes
    ○The “Assign Function Classes” dialog
    ○ Hierarchical Classes
    ○ Failure Classes
  ● Basic Coverage Filters
  ● Advanced Coverage Filters
  ● Creating Tests for Selected Classes
    ○Function vs. Failure Classes
    ○ Creating Tests for Sensors with Matching Class
  ● Creating / Assigning a Class to a Test’s Coverage

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the Advanced Techniques for using Path-Based Tests in eXpress
  ● Non-detectable Functions & Failure Modes (Path-Based Tests)
    ○ Marking Coverage Functions/Failures as non-detectable
      ▪ Using the Test Coverage panel
      ▪ Using the Explorer Tree (Including Batching)
    ○ Including Non-detectable Functions/Failures Modes in the Detection Coverage
      ▪ Using the Test Coverage panel
      ▪ Optional Asymmetry (“Detected but Not Proven”)
    ○ Constraining Test Coverage by Disabling Stimuli
      ▪ Asymmetric (“Creation Interference from Unmonitored Stimuli”)
      ▪ Point-to-Point Testing

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the use of Test Coverage Anchors in eXpress
  ● Definition Methods
    ○ Using the Test Coverage panel
      ▪ Using the Explorer Tree
    ○ Single Anchors
      ▪ Asymmetric (“Interference from Unanchored Coverage”)
      ▪ Symmetric (no interference)
    ○ Multiple Anchors
      ▪ Union (Coverage must reside in “at least one anchor’s path”)
      ▪ Intersection (Coverage must reside in “all anchors’ path”)
    ○ Failure Mode Anchors
      ▪ Fault Propagation Editing
    ○ Manipulating Interference
      ▪ Excluding Elements From Interference
      ▪ Converting Interference into Coverage

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the use of Hybrid Diagnostic in eXpress
  ● Functional vs. Failure Mode Coverage
    ○ Definition Methods
      ▪ Using the Test Coverage panel
      ▪ Using the Explorer Tree
      ▪ Setting the Coverage Type of a Test
    ○ Hybrid Testing and Diagnostics
      ▪ Chained Inferences
      ▪ Relationships between Failure Modes & Affected Functions
      ▪ Changing Tests to Failure Mode Coverage Changes the Diagnostics
    ○ Preventing New Coverage From Being Added to Path-Based Tests
      ▪ New Coverage on “Update” setting in Grid View (only)

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the use of Group Tests within eXpress.
  ● Reasons for deciding to use Group Tests
    ○ Coverage/Interference is not easily represented using a Single Test
    ○ Evaluating Multiple Tests as a Single Step in the Diagnostics
    ○ Representing a Single Test with Multiple Outcomes
  ● Single Test with Combined Coverage
    ○ Heterogeneous Group Tests (Grouping Different Test Types)
    ○ Groping Tests with Mixed Symmetries
    ○ Combing Tests From Multiple Lower-Level Designs
    ○ Hierarchical Inheritance of Group Tests

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the use of Group Tests within eXpress.
  ● Single Test with Multiple Outcomes
    ○ Appearance in the Diagnostic Flow Diagram
    ○ Automatic or User-Defined Outcome Order
    ○ Inference Approach
      ▪ Prove Coverage After the Last Test Passes
      ▪ Prove Coverage As Each Test Passes
    ○ Converting a Binary Test into a Multiple-Outcome Test
    ○ Test Outcome Labels / Descriptions
      ▪ Test Outcome Panel, Grid View, Imported
      ▪ Displayed in the Diagnostic Flow Diagram
      ▪ Displayed in the Fault Group Details Report
      ▪ Displayed during a Diagnostic Session
      ▪ Exported to DiagML

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).

As required DSI will setup a WebEx or Skype meeting at the specified time. Student(s) may provide an additional approved on-line connection as required by the student(s) technical restrictions for data sharing.

This topic explains the basic use of the DiagML Export Feature in eXpress
  ● Configurations and Settings Targeting Export Objectives
    ○ Discuss Deployment Options
      ▪ Export to Run-Time Authoring Tool (RTAT)
      ▪ Exporting for Static Diagnostic Applications
      ▪ Exporting for Dynamic Reasoning Environments
      ▪ Exporting to STAGE Health Management and Support Simulation Tool
    ○ Customizing Configurations, Settings and Exports
    ○ Importing DiagML into RTAT and eXpress Design Viewer
      ▪ Retrieving and loading DiagML file in RTAT
      ▪ Identifying the eXpress Design in RTAT
      ▪ Describe purpose of the “PD” file generated in RTAT for eXpress Design Viewer

Required: eXpress
Optional: None

Standard: Free using DSI provided examples.

Optional: $750 using student provided examples (Maximum of 4 hours of preparation time per course).