Upcoming Classes Course Description

(Certificated)

Course number	CE-364
Course Name	Continuing Education: Subsets and Diagnostic Analysis in eXpress
Format	One 60-90 minute session
Date (Time)	1/27/2026 (9:00 a.m. PDT)
On-Line Connection	WebEx
Description	An introduction to the use of subsets during diagnostic analysis in *eXpress, including: • Excluding design elements from the diagnostics / diagnostic analysis • Evaluating critical failures (critical failures detected, MTBCF) • Calculating Testability metrics for specific subsets of the design (SFE, etc.) • Slicing and dicing Testability metrics Lecture, demonstration & discussion
ISDD Tools	*eXpress*
Tuition	No tuition for this session
Availability	Limited to 25 Students